Articles dans des revues à comité de lecture
|Near-field and far-field modeling of scattered surface waves. Application to the Apertureless Scanning Near-field Optical Microscopy|
|Muller J., Parent G., Fumeron S., Jeandel G., Lacroix D.|
|JQSRT 112 (2011) 1162|
|DOI : 10.1016/j.jqsrt.2010.08.022|
The detection of surface waves through scanning near-field optical microscopy (SNOM) is a promising technique for thermal measurements at very small scales. Recent studies have shown that electromagnetic waves, in the vicinity of a scattering structure such as an atomic force microscopy (AFM) tip, can be scattered from near to far-field and thus detected. In the present work, a model based on the finite difference time domain (FDTD) method and the near-field to far-field (NFTFF) transformation for electromagnetic waves propagation is presented. This model has been validated by studying the electromagnetic field of a dipole in vacuum and close to a dielectric substrate. Then simulations for a tetrahedral tip close to an interface are presented and discussed.