Groupe de Physique Statistique

Equipe 106, Institut Jean Lamour

                     
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Articles dans des revues à comité de lecture

Near-field and far-field modeling of scattered surface waves. Application to the Apertureless Scanning Near-field Optical Microscopy
Muller J., Parent G., Fumeron S., Jeandel G., Lacroix D.
JQSRT 112 (2011) 1162
DOI : 10.1016/j.jqsrt.2010.08.022

The detection of surface waves through scanning near-field optical microscopy (SNOM) is a promising technique for thermal measurements at very small scales. Recent studies have shown that electromagnetic waves, in the vicinity of a scattering structure such as an atomic force microscopy (AFM) tip, can be scattered from near to far-field and thus detected. In the present work, a model based on the finite difference time domain (FDTD) method and the near-field to far-field (NFTFF) transformation for electromagnetic waves propagation is presented. This model has been validated by studying the electromagnetic field of a dipole in vacuum and close to a dielectric substrate. Then simulations for a tetrahedral tip close to an interface are presented and discussed.



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